Automating high-speed, high-accuracy gross leak test

Leak test system for air-tightly sealed
micro electronics devices


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SMD crystal devices are becoming smaller and smaller.
The LZ-3000 is a series of automatic leak test systems
developed for high-speed processing in gross leak tests on
micro electronics products such as air-tightly sealed SMD
crystal devices. It improves production efficiency and provides
optimum system for quality management.